Manipluting Instrument Envelopes/filters With Pattern Effect Commands

Is there any way to control the parameters of a sample instrument via pattern commands? For filter cutoff, for instance?

Beginners question forum?

And the answer is… no.

I figured the answer was no after reading through the tutorials.

I’m not a beginner.


Maybe this should be in the suggestions forum. The more pattern effects the better.

this topic is discussed here. We hope to take care of a XRNI revise during 2.x stage.