Is there any way to control the parameters of a sample instrument via pattern commands? For filter cutoff, for instance?
Beginners question forum?
And the answer is… no.
I figured the answer was no after reading through the tutorials.
I’m not a beginner.
Maybe this should be in the suggestions forum. The more pattern effects the better.
this topic is discussed here. We hope to take care of a XRNI revise during 2.x stage.